Open AccessX‐ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case study
Author(s) -
West Bradley M.,
Stuckelberger Michael,
Jeffries April,
Gangam Srikanth,
Lai Barry,
Stripe Benjamin,
Maser Jörg,
Rose Volker,
Vogt Stefan,
Bertoni Mariana I.
Publication year - 2017
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516015721
Subject(s) - attenuation , x ray fluorescence , optics , synchrotron , fluorescence , materials science , resolution (logic) , nanoscopic scale , solar cell , computational physics , analytical chemistry (journal) , physics , chemistry , nanotechnology , optoelectronics , computer science , chromatography , artificial intelligence
The study of a multilayered and multicomponent system by spatially resolved X‐ray fluorescence microscopy poses unique challenges in achieving accurate quantification of elemental distributions. This is particularly true for the quantification of materials with high X‐ray attenuation coefficients, depth‐dependent composition variations and thickness variations. A widely applicable procedure for use after spectrum fitting and quantification is described. This procedure corrects the elemental distribution from the measured fluorescence signal, taking into account attenuation of the incident beam and generated fluorescence from multiple layers, and accounts for sample thickness variations. Deriving from Beer–Lambert's law, formulae are presented in a general integral form and numerically applicable framework. The procedure is applied using experimental data from a solar cell with a Cu(In,Ga)Se 2 absorber layer, measured at two separate synchrotron beamlines with varied measurement geometries. This example shows the importance of these corrections in real material systems, which can change the interpretation of the measured distributions dramatically.