Open AccessDevelopment of a speckle‐based portable device for in situ metrology of synchrotron X‐ray mirrors
Author(s) -
Kashyap Yogesh,
Wang Hongchang,
Sawhney Kawal
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516012509
Subject(s) - metrology , optics , synchrotron , speckle pattern , synchrotron radiation , physics , computer science , materials science
A portable device for in situ metrology of synchrotron X‐ray mirrors based on the near‐field speckle scanning technique has been developed. Ultra‐high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X‐ray beam. In addition to the compact setup and ease of implementation, a user‐friendly graphical user interface has been developed to ensure that optimizing active X‐ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X‐ray mirrors.