Open AccessSimultaneous X‐ray fluorescence and scanning X‐ray diffraction microscopy at the Australian Synchrotron XFM beamline
Author(s) -
Jones Michael W. M.,
Phillips Nicholas W.,
van Riessen Grant A.,
Abbey Brian,
Vine David J.,
Nashed Youssef S. G.,
Mudie Stephen T.,
Afshar Nader,
Kirkham Robin,
Chen Bo,
Balaur Eugeniu,
de Jonge Martin D.
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516011917
Subject(s) - beamline , microscopy , synchrotron , scanning electron microscope , x ray fluorescence , materials science , optics , diffraction , fluorescence microscope , synchrotron radiation , fluorescence , analytical chemistry (journal) , chemistry , physics , chromatography , beam (structure)
Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X‐ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X‐ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super‐resolved ultra‐structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step‐ and fly‐scanning modes, robust, simultaneous XFM‐SXDM is demonstrated.