Open AccessX‐ray nanotomography and focused‐ion‐beam sectioning for quantitative three‐dimensional analysis of nanocomposites
Author(s) -
Shuck Christopher E.,
Frazee Mathew,
Gillman Andrew,
Beason Matthew T.,
Gunduz Ibrahim Emre,
Matouš Karel,
Winarski Robert,
Mukasyan Alexander S.
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516007992
Subject(s) - focused ion beam , materials science , nanometre , nanostructure , characterization (materials science) , synchrotron , micrometer , resolution (logic) , optics , ion beam analysis , transmission electron microscopy , microscopy , ion beam , beam (structure) , nanotechnology , ion , chemistry , composite material , physics , organic chemistry , artificial intelligence , computer science
Knowing the relationship between three‐dimensional structure and properties is paramount for complete understanding of material behavior. In this work, the internal nanostructure of micrometer‐size (∼10 µm) composite Ni/Al particles was analyzed using two different approaches. The first technique, synchrotron‐based X‐ray nanotomography, is a nondestructive method that can attain resolutions of tens of nanometers. The second is a destructive technique with sub‐nanometer resolution utilizing scanning electron microscopy combined with an ion beam and `slice and view' analysis, where the sample is repeatedly milled and imaged. The obtained results suggest that both techniques allow for an accurate characterization of the larger‐scale structures, while differences exist in the characterization of the smallest features. Using the Monte Carlo method, the effective resolution of the X‐ray nanotomography technique was determined to be ∼48 nm, while focused‐ion‐beam sectioning with `slice and view' analysis was ∼5 nm.