
HiSPoD : a program for high‐speed polychromatic X‐ray diffraction experiments and data analysis on polycrystalline samples
Author(s) -
Sun Tao,
Fezzaa Kamel
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516005804
Subject(s) - diffraction , beamline , optics , x ray crystallography , crystallite , advanced photon source , materials science , physics , analytical chemistry (journal) , chemistry , beam (structure) , metallurgy , chromatography
A high‐speed X‐ray diffraction technique was recently developed at the 32‐ID‐B beamline of the Advanced Photon Source for studying highly dynamic, yet non‐repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X‐rays, analysis of the diffraction data is challenging. Here, HiSPoD , a stand‐alone Matlab‐based software for analyzing the polychromatic X‐ray diffraction data from polycrystalline samples, is described. With HiSPoD , researchers are able to perform diffraction peak indexing, extraction of one‐dimensional intensity profiles by integrating a two‐dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.