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Sapphire hard X‐ray Fabry–Perot resonators for synchrotron experiments
Author(s) -
Tsai Yi-Wei,
Wu Yu-Hsin,
Chang Ying-Yi,
Liu Wen-Chung,
Liu Hong-Lin,
Chu Chia-Hong,
Chen Pei-Chi,
Lin Pao-Te,
Fu Chien-Chung,
Chang Shih-Lin
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516004999
Subject(s) - sapphire , resonance (particle physics) , crystal (programming language) , resonator , materials science , reflection (computer programming) , synchrotron , fabry–pérot interferometer , optics , optoelectronics , physics , atomic physics , laser , computer science , wavelength , programming language
Hard X‐ray Fabry–Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al 2 O 3 , acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X‐rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X‐ray cavity resonance and measurements using scanning electron microscopic and X‐ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.

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