Open AccessTime‐ and spatial‐resolved XAFS spectroscopy in a single shot: new analytical possibilities for in situ material characterization
Author(s) -
Buzanich Ana Guilherme,
Radtke Martin,
Reinholz Uwe,
Riesemeier Heinrich,
Emmerling Franziska
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577516003969
Subject(s) - monochromator , optics , detector , image resolution , materials science , x ray absorption fine structure , spectroscopy , beam (structure) , resolution (logic) , spectrometer , diffraction , physics , wavelength , quantum mechanics , artificial intelligence , computer science
A new concept that comprises both time‐ and lateral‐resolved X‐ray absorption fine‐structure information simultaneously in a single shot is presented. This uncomplicated set‐up was tested at the BAMline at BESSY‐II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy‐sensitive area detector, the so‐called color X‐ray camera, or by an area‐sensitive detector based on a CCD camera, in θ–2θ geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1 s together with a spatial resolution in one dimension of at least 50 µm is achieved.