Open AccessMeasurement of synchrotron‐radiation‐excited Kossel patterns
Author(s) -
Bortel G.,
Faigel G.,
Tegze M.,
Chumakov A.
Publication year - 2016
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577515019037
Subject(s) - synchrotron radiation , excitation , optics , radiation , beam (structure) , resolution (logic) , phase (matter) , detector , physics , cathode ray , noise (video) , materials science , range (aeronautics) , excited state , bragg's law , photon , electron , atomic physics , diffraction , nuclear physics , computer science , composite material , quantum mechanics , artificial intelligence , image (mathematics)
Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X‐rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two‐dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.