
Influence of crystal structure, ligand environment and morphology on Co L ‐edge XAS spectral characteristics in cobalt compounds
Author(s) -
Bora D. K.,
Cheng X.,
Kapilashrami M.,
Glans P. A.,
Luo Y.,
Guo J.H.
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577515017178
Subject(s) - x ray absorption spectroscopy , cobalt , absorption spectroscopy , electronic structure , synchrotron , chemistry , spectroscopy , crystal structure , spectral line , crystallography , analytical chemistry (journal) , crystal (programming language) , chemical physics , materials science , computational chemistry , inorganic chemistry , optics , physics , programming language , quantum mechanics , astronomy , computer science , chromatography
The electronic structure of a material plays an important role in its functionality for different applications which can be probed using synchrotron‐based spectroscopy techniques. Here, various cobalt‐based compounds, differing in crystal structure, ligands surrounding the central metal ion and morphology, have been studied by soft X‐ray absorption spectroscopy (XAS) at the Co L ‐edge in order to measure the effect of these parameters on the electronic structure. A careful qualitative analysis of the spectral branching ratio and relative intensities of the L 3 and L 2 peaks provide useful insight into the electronic properties of compounds such as CoO/Co(OH) 2 , CoCl 2 .6H 2 O/CoF 2 .4H 2 O, CoCl 2 /CoF 2 , Co 3 O 4 (bulk/nano/micro). For further detailed analysis of the XAS spectra, quantitative analysis has been performed by fitting the spectral profile with simulated spectra for a number of cobalt compounds using crystal field atomic multiplet calculations.