Open AccessEffect of X‐ray spot size on liquid jet photoelectron spectroscopy
Author(s) -
Olivieri Giorgia,
Goel Alok,
Kleibert Armin,
Brown Matthew A.
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577515016306
Subject(s) - pinhole (optics) , x ray photoelectron spectroscopy , beamline , optics , jet (fluid) , x ray , spectroscopy , spectral line , focus (optics) , resolution (logic) , materials science , beam (structure) , physics , nuclear magnetic resonance , computer science , quantum mechanics , astronomy , artificial intelligence , thermodynamics
A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X‐ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) × 100 (h) µm to 75 × 45 µm for a vertical exit slit of 100 µm. The smaller X‐ray spot results in a substantial decrease in the gas‐phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments.