Open AccessSimultaneous nanocalorimetry and fast XRD measurements to study the silicide formation in Pd/a‐Si bilayers
Author(s) -
MolinaRuiz Manel,
FerrandoVillalba Pablo,
RodríguezTinoco Cristian,
Garcia Gemma,
RodríguezViejo Javier,
Peral Inma,
Lopeandía Aitor F.
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577515004683
Subject(s) - silicide , crystallite , materials science , amorphous solid , diffraction , palladium , scattering , crystallography , phase (matter) , silicon , analytical chemistry (journal) , optics , chemistry , optoelectronics , physics , metallurgy , organic chemistry , catalysis
The use of a membrane‐based chip nanocalorimeter in a powder diffraction beamline is described. Simultaneous wide‐angle X‐ray scattering and scanning nanocalorimetric measurements are performed on a thin‐film stack of palladium/amorphous silicon (Pd/a‐Si) at heating rates from 0.1 to 10 K s −1 . The nanocalorimeter works under a power‐compensation scheme previously developed by the authors. Kinetic and structural information of the consumed and created phases can be obtained from the combined techniques. The formation of Pd 2 Si produces a broad calorimetric peak that contains overlapping individual processes. It is shown that Pd consumption precedes the formation of the crystalline Pd 2 Si phase and that the crystallite size depends on the heating rate of the experiment.