Open AccessSoft X‐ray angle‐resolved photoemission with micro‐positioning techniques for metallic V 2 O 3
Author(s) -
Fujiwara Hidenori,
Kiss Takayuki,
Wakabayashi Yuki K.,
Nishitani Yoshito,
Mori Takeo,
Nakata Yuki,
Kitayama Satoshi,
Fukushima Kazuaki,
Ikeda Shinji,
Fuchimoto Hiroto,
Minowa Yosuke,
Mo SungKwan,
Denlinger Jonathan D.,
Allen James W.,
Metcalf Patricia,
Imai Masaki,
Yoshimura Kazuyoshi,
Suga Shigemasa,
Muro Takayuki,
Sekiyama Akira
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577515003707
Subject(s) - materials science , angle resolved photoemission spectroscopy , photoemission spectroscopy , inverse photoemission spectroscopy , x ray photoelectron spectroscopy , cleavage (geology) , optics , photon energy , metal , spectral line , spectroscopy , photon , physics , nuclear magnetic resonance , astronomy , fracture (geology) , metallurgy , composite material , quantum mechanics
Soft X‐ray angle‐resolved photoemission has been performed for metallic V 2 O 3 . By combining a microfocus beam (40 µm × 65 µm) and micro‐positioning techniques with a long‐working‐distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high‐quality flat regions on the sample surface, it has been possible to perform band mapping using both photon‐energy and polar‐angle dependences, opening the door to three‐dimensional angle‐resolved photoemission spectroscopy for typical three‐dimensional correlated materials where large cleavage planes are rarely obtained.