Open AccessTowards RIP using free‐electron laser SFX data
Author(s) -
Galli Lorenzo,
Son SangKil,
White Thomas A.,
Santra Robin,
Chapman Henry N.,
Nanao Max H.
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514027854
Subject(s) - femtosecond , free electron laser , laser , substructure , phaser , ionization , electron , free electron model , atomic physics , radiation , materials science , physics , optics , nuclear physics , engineering , ion , structural engineering , quantum mechanics
Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation‐damage‐induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free‐electron laser facilities.