Open AccessX‐ray diffraction strain analysis of a single axial InAs 1– x P x nanowire segment
Author(s) -
Keplinger Mario,
Mandl Bernhard,
Kriegner Dominik,
Holý Václav,
Samuelsson Lars,
Bauer Günther,
Deppert Knut,
Stangl Julian
Publication year - 2015
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057751402284x
Subject(s) - wurtzite crystal structure , nanowire , diffraction , materials science , condensed matter physics , x ray crystallography , crystallography , molecular physics , optics , nanotechnology , physics , chemistry
The spatial strain distribution in and around a single axial InAs 1– x P x hetero‐segment in an InAs nanowire was analyzed using nano‐focused X‐ray diffraction. In connection with finite‐element‐method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero‐segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble‐averaging high‐resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc‐blende crystal polytypes in the nanowires.