Open AccessCorrecting for surface topography in X‐ray fluorescence imaging
Author(s) -
Geil E. C.,
Thorne R. E.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057751401875x
Subject(s) - x ray fluorescence , fluorescence , optics , planar , fluorescence lifetime imaging microscopy , materials science , detector , surface (topology) , matrix (chemical analysis) , physics , computer science , geometry , computer graphics (images) , mathematics , composite material
Samples with non‐planar surfaces present challenges for X‐ray fluorescence imaging analysis. Here, approximations are derived to describe the modulation of fluorescence signals by surface angles and topography, and suggestions are made for reducing this effect. A correction procedure is developed that is effective for trace element analysis of samples having a uniform matrix, and requires only a fluorescence map from a single detector. This procedure is applied to fluorescence maps from an incised gypsum tablet.