Open AccessCoherent imaging at the diffraction limit
Author(s) -
Thibault Pierre,
GuizarSicairos Manuel,
Menzel Andreas
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514015343
Subject(s) - ptychography , coherent diffraction imaging , metrology , optics , diffraction , quantum decoherence , characterization (materials science) , sensitivity (control systems) , physics , phase retrieval , computer science , electronic engineering , engineering , quantum mechanics , quantum , fourier transform
X‐ray ptychography, a scanning coherent diffractive imaging technique, holds promise for imaging with dose‐limited resolution and sensitivity. If the foreseen increase of coherent flux by orders of magnitude can be matched by additional technological and analytical advances, ptychography may approach imaging speeds familiar from full‐field methods while retaining its inherently quantitative nature and metrological versatility. Beyond promises of high throughput, spectroscopic applications in three dimensions become feasible, as do measurements of sample dynamics through time‐resolved imaging or careful characterization of decoherence effects.