Open AccessPtychography with multilayer Laue lenses
Author(s) -
Kubec Adam,
Braun Stefan,
Niese Sven,
Krüger Peter,
Patommel Jens,
Hecker Michael,
Leson Andreas,
Schroer Christian G.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514014556
Subject(s) - lens (geology) , optics , focal length , fabrication , ptychography , materials science , characterization (materials science) , microscope , microlens , physics , diffraction , medicine , alternative medicine , pathology
Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 µm and 53 µm, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one‐ and two‐dimensional focusing. The latter is realised with a directly bonded assembly of two crossed lenses, that reduces the distance between the lenses in the beam direction to 30 µm and eliminates the necessity of producing different multilayer systems. Characterization of lens fabrication was performed using a laboratory X‐ray microscope. Focusing properties have been investigated using ptychography.