Open AccessScanning force microscope for in situ nanofocused X‐ray diffraction studies
Author(s) -
Ren Zhe,
Mastropietro Francesca,
Davydok Anton,
Langlais Simon,
Richard MarieIngrid,
Furter JeanJacques,
Thomas Olivier,
Dupraz Maxime,
Verdier Marc,
Beutier Guillaume,
Boesecke Peter,
Cornelius Thomas W.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514014532
Subject(s) - diffraction , materials science , synchrotron , in situ , x ray crystallography , optics , microscope , crystallinity , atomic force microscopy , microscopy , synchrotron radiation , sapphire , nanotechnology , chemistry , physics , composite material , laser , organic chemistry
A compact scanning force microscope has been developed for in situ combination with nanofocused X‐ray diffraction techniques at third‐generation synchrotron beamlines. Its capabilities are demonstrated on Au nano‐islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X‐ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X‐ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.