Open AccessLinear fitting of multi‐threshold counting data with a pixel‐array detector for spectral X‐ray imaging
Author(s) -
Muir Ryan D.,
Pogranichney Nicholas R.,
Muir J. Lewis,
Sullivan Shane Z.,
Battaile Kevin P.,
Mulichak Anne M.,
Toth Scott J.,
Keefe Lisa J.,
Simpson Garth J.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514014167
Subject(s) - pixel , photon counting , physics , detector , optics , energy (signal processing) , photon energy , intensity (physics) , wavelength , photon , voltage , quantum mechanics
Experiments and modeling are described to perform spectral fitting of multi‐threshold counting measurements on a pixel‐array detector. An analytical model was developed for describing the probability density function of detected voltage in X‐ray photon‐counting arrays, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Each pixel was mathematically calibrated by fitting the detected voltage distributions to the model at both 13.5 keV and 15.0 keV X‐ray energies. The model and established pixel responses were then exploited to statistically recover images of X‐ray intensity as a function of X‐ray energy in a simulated multi‐wavelength and multi‐counting threshold experiment.