Open AccessRonchi test for characterization of X‐ray nanofocusing optics and beamlines
Author(s) -
Uhlén Fredrik,
Rahomäki Jussi,
Nilsson Daniel,
Seiboth Frank,
Sanz Claude,
Wagner Ulrich,
Rau Christoph,
Schroer Christian G.,
Vogt Ulrich
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057751401323x
Subject(s) - beamline , optics , x ray optics , interferometry , physics , coherence (philosophical gambling strategy) , advanced photon source , lens (geology) , interference (communication) , degree of coherence , characterization (materials science) , materials science , beam (structure) , x ray , computer science , computer network , channel (broadcasting) , quantum mechanics
A Ronchi interferometer for hard X‐rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X‐ray optics: a compound refractive lens and a zone plate.