Open AccessData analysis method to achieve sub‐10 pm spatial resolution using extended X‐ray absorption fine‐structure spectroscopy
Author(s) -
Du Yonghua,
Wang Jiaou,
Jiang Longhua,
Borgna Lucas Santiago,
Wang Yanfei,
Zheng Yi,
Hu Tiandou
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514010406
Subject(s) - extended x ray absorption fine structure , materials science , resolution (logic) , spectroscopy , x ray absorption spectroscopy , image resolution , absorption (acoustics) , absorption spectroscopy , distortion (music) , analytical chemistry (journal) , optics , chemistry , physics , computer science , optoelectronics , amplifier , cmos , chromatography , quantum mechanics , artificial intelligence , composite material
Obtaining sub‐10 pm spatial resolution by extended X‐ray absorption fine structure (EXAFS) spectroscopy is required in many important fields of research, such as lattice distortion studies in colossal magnetic resistance materials, high‐temperature superconductivity materials etc. However, based on the existing EXAFS data analysis methods, EXAFS has a spatial resolution limit of π/2Δ k which is larger than 0.1 Å. In this paper a new data analysis method which can easily achieve sub‐10 pm resolution is introduced. Theoretically, the resolution limit of the method is three times better than that normally available. The method is examined by numerical simulation and experimental data. As a demonstration, the LaFe 1– x Cr x O 3 system ( x = 0, 1/3, 2/3) is studied and the structural information of FeO 6 octahedral distortion as a function of Cr doping is resolved directly from EXAFS, where a resolution better than 0.074 Å is achieved.