Open AccessEfficient focusing of 8 keV X‐rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling. Erratum
Author(s) -
Mayer Marcel,
Keskinbora Kahraman,
Grévent Corinne,
Szeghalmi Adriana,
Knez Mato,
Weigand Markus,
Snigirev Anatoly,
Snigireva Irina,
Schütz Gisela
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577514006699
Subject(s) - synchrotron , layer (electronics) , deposition (geology) , materials science , beam (structure) , ion beam , ion , synchrotron radiation , optics , atomic layer deposition , physics , nanotechnology , geology , quantum mechanics , paleontology , sediment
Corrections to the article by Mayer et al. [ J. Synchrotron Rad. (2013), 20, 433440 ] are given.