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Point spread function measurement of an X‐ray beam focused by a multilayer zone plate with narrow annular aperture
Author(s) -
Takano Hidekazu,
Konishi Shigeki,
Koyama Takahisa,
Tsusaka Yoshiyuki,
Ichimaru Satoshi,
Ohchi Tadayuki,
Takenaka Hisataka,
Kagoshima Yasushi
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577513034644
Subject(s) - optics , monochromator , undulator , monochromatic color , diffraction , aperture (computer memory) , beam (structure) , zone plate , physics , point spread function , materials science , beamline , wavelength , acoustics
The experimental procedure for obtaining the point spread function (PSF) of a focusing beam generated using an X‐ray multilayer zone plate (MZP) with a narrow annular aperture has been developed. It was possible to reconstruct the PSF by applying the tomographic process to the measured dataset consisting of line spread functions (LSFs) in every radial direction on the focal plane. The LSFs were measured by a knife‐edge scanning method of detecting scattered intensity. In the experimental work, quasi‐monochromatic undulator radiation with a first harmonic energy of 20 keV was directly focused without a monochromator by the MZP, and the PSF was measured using this procedure. As a result, a near diffraction‐limited focused beam size of 46 nm full width at half‐maximum was obtained.

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