Open AccessHigh‐resolution thermal imaging with a combination of nano‐focus X‐ray diffraction and ultra‐fast chip calorimetry
Author(s) -
Rosenthal Martin,
Doblas David,
Hernandez Jaime J.,
Odarchenko Yaroslav I.,
Burghammer Manfred,
Di Cola Emanuela,
Spitzer Denis,
Antipov A. E.,
Aldoshin L. S.,
Ivanov Dimitri A.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577513024892
Subject(s) - calorimetry , diffraction , materials science , nano , focus (optics) , resolution (logic) , optics , chip , x ray , thermal , nanotechnology , optoelectronics , physics , computer science , telecommunications , artificial intelligence , composite material , thermodynamics , meteorology
A microelectromechanical‐systems‐based calorimeter designed for use on a synchrotron nano‐focused X‐ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤1 K s −1 ) and temperature modulation frequencies (≤1 kHz). The calorimeter was used for high‐resolution thermal imaging of nanogram‐sized samples subjected to X‐ray‐induced heating. For a 46 ng indium particle, the measured temperature rise reaches ∼0.2 K, and is directly correlated to the X‐ray absorption. Thermal imaging can be useful for studies of heterogeneous materials exhibiting physical and/or chemical transformations. Moreover, the technique can be extended to three‐dimensional thermal nanotomography.