Open AccessTests and characterization of a laterally graded multilayer Montel mirror
Author(s) -
Mundboth K.,
Sutter J.,
Laundy D.,
Collins S.,
Stoupin S.,
Shvyd'ko Y.
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577513024077
Subject(s) - collimated light , optics , reflectometry , characterization (materials science) , x ray optics , metrology , spectrometer , ray tracing (physics) , physics , scattering , resolution (logic) , materials science , laser , computer science , x ray , time domain , artificial intelligence , computer vision
Multilayers are becoming an increasingly important tool in X‐ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel‐type configuration for use as an X‐ray collimating device are provided. The results of X‐ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X‐ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra‐high‐resolution inelastic X‐ray scattering spectrometer at the Advanced Photon Source.