Open AccessPinhole‐type two‐dimensional ultra‐small‐angle X‐ray scattering on the micrometer scale
Author(s) -
Kishimoto Hiroyuki,
Shinohara Yuya,
Suzuki Yoshio,
Takeuchi Akihisa,
Yagi Naoto,
Amemiya Yoshiyuki
Publication year - 2014
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577513023205
Subject(s) - beamline , pinhole (optics) , optics , spring 8 , scattering , small angle x ray scattering , small angle scattering , resolution (logic) , materials science , detector , x ray , physics , synchrotron , micrometer , solid angle , beam (structure) , artificial intelligence , computer science
A pinhole‐type two‐dimensional ultra‐small‐angle X‐ray scattering set‐up at a so‐called medium‐length beamline at SPring‐8 is reported. A long sample‐to‐detector distance, 160.5 m, can be used at this beamline and a small‐angle resolution of 0.25 µm −1 was thereby achieved at an X‐ray energy of 8 keV.