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Spatial correlation of embedded nanowires probed by X‐ray off‐Bragg scattering of the host matrix
Author(s) -
Tran Thomas,
Weng Xiaorong,
Hennes Marcel,
Demaille Dominique,
Coati Alessandro,
Vlad Alina,
Garreau Yves,
Sauvage-Simkin Michèle,
Sacchi Maurizio,
Vidal Franck,
Zheng Yunlin
Publication year - 2021
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576721006579
Subject(s) - scattering , nanowire , bragg's law , materials science , matrix (chemical analysis) , synchrotron radiation , optics , synchrotron , crystallinity , diffraction , host (biology) , physics , optoelectronics , composite material , ecology , biology
It is shown that information on the spatial correlation of nano‐objects embedded in a crystalline matrix can be retrieved by analysing the X‐ray scattering around the Bragg reflections of the host matrix. Data are reported for vertically aligned Ni and CoNi alloy nanowires (NWs) in an SrTiO 3 matrix. When the Bragg condition is fulfilled for the matrix and not for the NWs, the latter can be approximated by voids, and the scattering around the matrix reflections contains information on the self‐correlation of the NWs ( i.e. on their diameter d ) and on the correlation between NWs (interdistance D ). Nondestructive synchrotron X‐ray diffraction data provide information on these values averaged over large areas, complementing local transmission electron microscopy observations. The measurements show that off‐Bragg scattering around the matrix reflections can be exploited to study the spatial correlation and morphology of embedded nano‐objects, independently of their crystallinity or strain or the presence of defects.