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`Pink'‐beam X‐ray powder diffraction profile and its use in Rietveld refinement
Author(s) -
Von Dreele Robert B.,
Clarke Samantha M.,
Walsh James P. S.
Publication year - 2021
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720014624
Subject(s) - synchrotron , rietveld refinement , powder diffraction , diffraction , x ray , beam (structure) , x ray crystallography , materials science , synchrotron radiation , voigt profile , resolution (logic) , crystallography , optics , physics , chemistry , computer science , spectral line , astronomy , artificial intelligence
The powder diffraction profile obtained with a pink‐beam synchrotron X‐ray source is described as the convolution of a back‐to‐back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo‐Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100 ps synchrotron X‐ray micropulse.