`Pink'‐beam X‐ray powder diffraction profile and its use in Rietveld refinement | Zendy

Von Dreele Robert B. | Zendy; Clarke Samantha M. | Zendy; Walsh James P. S. | Zendy

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`Pink'‐beam X‐ray powder diffraction profile and its use in Rietveld refinement

Author(s) -

Von Dreele Robert B.,

Clarke Samantha M.,

Walsh James P. S.

Publication year - 2021

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s1600576720014624

Subject(s) - synchrotron , rietveld refinement , powder diffraction , diffraction , x ray crystallography , beam (structure) , x ray , materials science , voigt profile , synchrotron radiation , gaussian , resolution (logic) , crystallography , optics , physics , chemistry , computer science , spectral line , astronomy , artificial intelligence , quantum mechanics

The powder diffraction profile obtained with a pink‐beam synchrotron X‐ray source is described as the convolution of a back‐to‐back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo‐Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100 ps synchrotron X‐ray micropulse.

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