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A new parafocusing paradigm for X‐ray diffraction
Author(s) -
Prokopiou Danae,
McGovern James,
Davies Gareth,
Godber Simon,
Evans Paul,
Dicken Anthony,
Rogers Keith
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720008651
Subject(s) - diffraction , optics , detector , bragg's law , maxima , beam (structure) , scattering , physics , pencil (optics) , bragg peak , flat panel detector , intensity (physics) , point (geometry) , computational physics , geometry , mathematics , art , performance art , art history
A new approach to parafocusing X‐ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat‐specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular‐ and energy‐dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil‐beam arrangement.