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A laboratory transmission diffraction Laue setup to evaluate single‐crystal quality
Author(s) -
Arnaud Alexiane,
Guediche Wijdène,
Remacha Clément,
Romero Edward,
Proudhon Henry
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720006317
Subject(s) - misorientation , optics , diffraction , collimated light , orientation (vector space) , monocrystalline silicon , rotation (mathematics) , materials science , physics , computer science , optoelectronics , geometry , mathematics , laser , microstructure , grain boundary , metallurgy , artificial intelligence , silicon
A scanning laboratory Laue transmission setup is developed to probe extended quasi‐monocrystalline samples. Orientation mapping is achieved by controlling the collimation of the incident beam and scanning the position of the specimen. An automated indexing algorithm for transmission Laue patterns is presented, together with a forward simulation model adapted for a laboratory setup. The effect of the main parameters of the system is studied with the aim of achieving exposure times of the order of one second. Applications are presented to probe the orientation of an extended part and detect disoriented regions within the bulk. Finally, the analysis of diffraction spot shapes shows that the misorientation within the illuminated volume can be measured, and a new method is proposed to evaluate its complete mean lattice rotation tensor.