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Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals
Author(s) -
Gradwohl Kevin-P.,
Danilewsky Andreas N.,
Roder Melissa,
Schmidbauer Martin,
Janicskó-Csáthy József,
Gybin Alexander,
Abrosimov Nikolay,
Sumathi R. Radhakrishnan
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720005993
Subject(s) - dislocation , germanium , materials science , diffraction , crystallography , single crystal , x ray crystallography , homogeneous , crystal (programming language) , optics , condensed matter physics , composite material , chemistry , silicon , physics , thermodynamics , optoelectronics , programming language , computer science
White‐beam X‐ray topography has been performed to provide direct evidence of micro‐voids in dislocation‐free high‐purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation‐free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.