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Equatorial aberration of powder diffraction data collected with an Si strip X‐ray detector by a continuous‐scan integration method
Author(s) -
Ida Takashi
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720005130
Subject(s) - diffractometer , detector , powder diffraction , diffraction , powder diffractometer , optics , x ray , materials science , x ray crystallography , physics , computational physics , crystallography , chemistry , scanning electron microscope
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X‐ray detector in continuous‐scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.