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Determination of the full deformation tensor by multi‐Bragg fast scanning nano X‐ray diffraction
Author(s) -
Johannes Andreas,
Rensberg Jura,
Grünewald Tilman A.,
Schöppe Philipp,
Ritzer Maurizio,
Rosenthal Martin,
Ronning Carsten,
Burghammer Manfred
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719016534
Subject(s) - deformation (meteorology) , tensor (intrinsic definition) , materials science , optics , diffraction , position (finance) , resolution (logic) , geometry , physics , composite material , mathematics , computer science , artificial intelligence , finance , economics
This work showcases a method to map the full deformation tensor in a single micro‐sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as‐grown single‐crystal VO 2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10 −4 in an 8 × 14 µm projected area of the wire. With a beam‐defined spatial resolution of 150 × 150 nm, the measurement time was merely 2.5 h.