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High‐resolution SAXS setup with tuneable resolution in direct and reciprocal space: a new tool to study ordered nanostructures
Author(s) -
Chumakov Andrei P.,
Napolskii Kirill S.,
Petukhov Andrei V.,
Snigirev Anatoly A.,
Snigireva Irina I.,
Roslyakov Ilya V.,
Grigoriev Sergey V.
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719011221
Subject(s) - reciprocal lattice , small angle x ray scattering , materials science , scattering , diffraction , resolution (logic) , optics , nanostructure , angular resolution (graph drawing) , crystallography , nanotechnology , physics , computer science , chemistry , mathematics , combinatorics , artificial intelligence
A novel compact small‐angle X‐ray scattering (SAXS) setup with tuneable resolution in both direct and reciprocal space has been designed and tested for the study of nanostructured materials with a hierarchical structure. The setup exploits a set of compound refractive lenses that focus the X‐ray beam at the detector position. Anodic alumina membranes with a self‐ordered porous structure were chosen as test samples. The setup allows patterns to be collected with a minimum scattering vector value of 0.001 nm −1 and gives the possibility for an easy continuous switch between taking high‐resolution statistically averaged diffraction data of macroscopically large sample volumes and lower‐resolution diffraction on a small single domain of the anodic aluminium oxide film. It is revealed that the pores are longitudinal and their ordering within each domain tends towards the ideal hexagonal structure, whereas the in‐plane orientation of the pore arrays changes from domain to domain. The possible advantages and disadvantages of the proposed compact SAXS scheme are discussed.