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GIDVis : a comprehensive software tool for geometry‐independent grazing‐incidence X‐ray diffraction data analysis and pole‐figure calculations
Author(s) -
Schrode Benedikt,
Pachmajer Stefan,
Dohr Michael,
Röthel Christian,
Domke Jari,
Fritz Torsten,
Resel Roland,
Werzer Oliver
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719004485
Subject(s) - x ray , diffraction , geometry , software , optics , physics , materials science , crystallography , computer science , mathematics , chemistry , programming language
GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing‐incidence thin‐film X‐ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation ( e.g. cuts and integrations along specific reciprocal‐space directions), crystal phase analysis etc . To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single‐crystalline Au(111) surface.