Premium
Quantitative nanotomography of amorphous and polycrystalline samples using coherent X‐ray diffraction
Author(s) -
Chushkin Y.,
Zontone F.,
Cherkas O.,
Gibaud A.
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719004394
Subject(s) - crystallinity , diffraction , materials science , amorphous solid , crystallite , synchrotron radiation , x ray crystallography , optics , resolution (logic) , coherent diffraction imaging , scattering , characterization (materials science) , synchrotron , crystal (programming language) , crystallography , analytical chemistry (journal) , chemistry , physics , nanotechnology , composite material , phase retrieval , programming language , chromatography , fourier transform , quantum mechanics , artificial intelligence , computer science , metallurgy
This article presents a combined approach where quantitative forward‐scattering coherent diffraction imaging (CDI) is supported by crystal diffraction using 8.1 keV synchrotron X‐ray radiation. The method allows the determination of the morphology, mass density and crystallinity of an isolated microscopic specimen. This approach is tested on three homogeneous samples made of different materials with different degrees of crystallinity. The mass density and morphology are revealed using three‐dimensional coherent diffraction imaging with a resolution better than 36 nm. The crystallinity is extracted from the diffraction profiles measured simultaneously with coherent diffraction patterns. The presented approach extends CDI to structural characterization of samples when crystallinity aspects are of interest.