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Comparison of electron backscatter and X‐ray diffraction techniques for measuring dislocation density in Zircaloy‐2
Author(s) -
Skippon T.,
Balogh L.,
Daymond M. R.
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719003054
Subject(s) - electron backscatter diffraction , materials science , dislocation , diffraction , synchrotron , optics , crystallography , composite material , microstructure , chemistry , physics
Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy‐2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X‐ray line profile analysis (LPA). It was found that the EBSD‐based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post‐processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.