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d2Dplot : 2D X‐ray diffraction data processing and analysis for through‐the‐substrate microdiffraction
Author(s) -
Vallcorba Oriol,
Rius Jordi
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s160057671900219x
Subject(s) - diffraction , computer science , background subtraction , calibration , data processing , set (abstract data type) , visualization , substrate (aquarium) , subtraction , data set , graphical user interface , computer graphics (images) , database , optics , data mining , physics , artificial intelligence , geology , mathematics , statistics , pixel , oceanography , arithmetic , programming language
The d2Dplot computer program provides a set of tools for the visualization, processing and analysis of 2D X‐ray diffraction (2DXRD) data. Among the operations available there are the sum/subtraction of 2DXRD images, conversion to 1D data (powder pattern), azimuthal plotting, calibration of instrumental parameters, background subtraction and a command‐line mode to run operations inside data processing pipelines. The graphical user interface allows easy use of the program. It also includes two main features: (i) the possibility of creating a user compound database to help in the fast phase identification of similar samples, and (ii) a detailed peak analysis routine for the application of the through‐the‐substrate microdiffraction methodology.