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Grazing‐incidence X‐ray scattering of lamellar thin films
Author(s) -
Smilgies Detlef-M.
Publication year - 2019
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576719000402
Subject(s) - lamellar structure , thin film , scattering , crystallinity , grazing incidence small angle scattering , materials science , optics , substrate (aquarium) , polymer , crystallography , composite material , nanotechnology , chemistry , physics , small angle neutron scattering , oceanography , neutron scattering , geology
Recently, surface and thin‐film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X‐ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.