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A multipurpose instrument for time‐resolved ultra‐small‐angle and coherent X‐ray scattering
Author(s) -
Narayanan Theyencheri,
Sztucki Michael,
Van Vaerenbergh Pierre,
Léonardon Joachim,
Gorini Jacques,
Claustre Laurent,
Sever Franc,
Morse John,
Boesecke Peter
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718012748
Subject(s) - beamline , detector , optics , scattering , physics , millisecond , small angle scattering , instrumentation (computer programming) , beam (structure) , photon , astronomy , computer science , operating system
This article presents the main technical features and performance of the upgraded beamline ID02 at the ESRF. The beamline combines different small‐angle X‐ray scattering techniques in one unique instrument, enabling static and kinetic investigations from ångström to micrometre size scales and time resolution down to the sub‐millisecond range. The main component of the instrument is an evacuated detector tube of length 34 m and diameter 2 m. Several different detectors are housed inside a motorized wagon that travels along a rail system, allowing an automated change of the sample–detector distance from about 1 to 31 m as well as selection of the desired detector. For optional combined wide‐angle scattering measurements, a wide‐angle detector is installed at the entrance cone of the tube. A scattering vector (of magnitude q ) range of 0.002 ≤ q ≤ 50 nm −1 is covered with two sample–detector distances and a single‐beam setting for an X‐ray wavelength of 1 Å. In the high‐resolution mode, two‐dimensional ultra‐small‐angle X‐ray scattering patterns down to q < 0.001 nm −1 can be recorded, and the resulting one‐dimensional profiles have superior quality as compared to those measured with an optimized Bonse–Hart instrument. In the highest‐resolution mode, the beam is nearly coherent, thereby permitting multispeckle ultra‐small‐angle X‐ray photon correlation spectroscopy measurements. The main applications of the instrument include the elucidation of static and transient hierarchical structures, and nonequilibrium dynamics in soft matter and biophysical systems.