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Real‐time study of transients during high‐temperature creep of an Ni‐base superalloy by far‐field high‐energy synchrotron X‐ray diffraction
Author(s) -
Tréhorel Roxane,
Ribarik Gabor,
Schenk Thomas,
Jacques Alain
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718010014
Subject(s) - superalloy , creep , materials science , misorientation , synchrotron , diffraction , single crystal , crystal (programming language) , coalescence (physics) , x ray , optics , crystallography , composite material , physics , microstructure , grain boundary , chemistry , computer science , programming language , astrobiology
The high‐temperature mechanical behavior of single‐crystal Ni‐base superalloys has been formerly studied by in situ triple‐crystal synchrotron X‐ray diffractometry (TCD). However, the 1/300 s recording frequency does not allow real‐time tests. It is shown here that real‐time monitoring is possible with far‐field diffractometry in transmission. The use of a far‐field camera enables one to follow a diffraction spot with high angular precision and high recording speed. This technique allows measurement of the mechanical response of an AM1 Ni‐base single‐crystal superalloy following steep load jumps and relaxations during high‐temperature creep tests. Local crystal misorientation is revealed and rafting (oriented coalescence) is examined. This new technique is compared with TCD, in order to highlight its benefits and drawbacks.