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Measurement of independent piezoelectric moduli of Ca 3 NbGa 3 Si 2 O 14 , La 3 Ga 5.5 Ta 0.5 O 14 and La 3 Ga 5 SiO 14 single crystals
Author(s) -
Irzhak D.,
Roshchupkin D.
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718009184
Subject(s) - piezoelectricity , moduli , diffractometer , x ray crystallography , crystallography , materials science , electric field , analytical chemistry (journal) , mineralogy , crystal structure , chemistry , physics , diffraction , optics , composite material , chromatography , quantum mechanics
Results of measurements of independent piezoelectric moduli d 11 and d 14 in Ca 3 NbGa 3 Si 2 O 14 , La 3 Ga 5.5 Ta 0.5 O 14 and La 3 Ga 5 SiO 14 , promising single crystals of the calcium gallogermanate structural type, are presented. The moduli were measured with a triple‐axis X‐ray diffractometer under an external electric field which causes changes in the interplanar distances due to the reverse piezoelectric effect. The results of the X‐ray diffractometry measurements agree fairly well (within less than 10%) with the results obtained by different methods.