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Ni/GeSn solid‐state reaction monitored by combined X‐ray diffraction analyses: focus on the Ni‐rich phase
Author(s) -
Quintero Andrea,
Gergaud Patrice,
Aubin Joris,
Hartmann Jean-Michel,
Reboud Vincent,
Rodriguez Philippe
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718008786
Subject(s) - metastability , diffraction , phase (matter) , reciprocal lattice , crystallography , materials science , plane (geometry) , pole figure , hexagonal crystal system , solid state , x ray , x ray crystallography , focus (optics) , analytical chemistry (journal) , chemistry , optics , geometry , physics , mathematics , organic chemistry , chromatography
The Ni/Ge 0.9 Sn 0.1 solid‐state reaction was monitored by combining in situ X‐ray diffraction, in‐plane reciprocal space map measurements and in‐plane pole figures. A sequential growth was shown, in which the first phase formed was an Ni‐rich phase. Then, at 518 K, the mono‐stanogermanide phase Ni(Ge 0.9 Sn 0.1 ) was observed. This phase was stable up to 873 K. Special attention has been given to the nature and the crystallographic orientation of the Ni‐rich phase obtained at low temperature. It is demonstrated, with in‐plane pole figure measurements and simulation, that it was the ϵ‐Ni 5 (Ge 0.9 Sn 0.1 ) 3 metastable phase with a hexagonal structure.