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How to distinguish between opposite faces of an a ‐plane sapphire wafer
Author(s) -
Yunin Pavel Andreevich,
Drozdov Yurii Nikolaevich
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718001383
Subject(s) - sapphire , wafer , sign (mathematics) , plane (geometry) , diffraction , optics , contrast (vision) , materials science , orientation (vector space) , face (sociological concept) , optoelectronics , physics , geometry , mathematics , mathematical analysis , laser , social science , sociology
A method to distinguish between two symmetrically equivalent opposite and faces of an a ‐plane sapphire wafer is described. It is shown that use of conventional X‐ray diffraction analysis makes it possible to determine the `sign' of the sapphire a face in contrast to the `sign' of the c , m or r faces. Correct determination of the a ‐plane wafer orientation is important for further growth and processing of heteroepitaxial structures.