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Low‐angle boundaries in ZnGeP 2 single crystals
Author(s) -
Lei Zuotao,
Okunev Aleksei,
Zhu Chongqiang,
Verozubova Galina,
Yang Chunhui
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576718001097
Subject(s) - materials science , dislocation , crystallography , slip (aerodynamics) , condensed matter physics , thermoelastic damping , dislocation creep , enhanced data rates for gsm evolution , grain boundary , tilt (camera) , geometry , physics , composite material , chemistry , microstructure , thermal , telecommunications , mathematics , meteorology , computer science , thermodynamics
The structure of low‐angle boundaries in ZnGeP 2 crystals grown by the vertical Bridgman technique was studied using Borrmann X‐ray topography. The slip systems of the dislocations in the boundaries were identified by studying the contrast rosettes generated by the Borrmann effect, in the region near the dislocation core. It was shown that the boundaries are of two types: type I consists of edge dislocations of the {10}⟨110⟩ slip system, and type II of edge and mixed dislocations of the {010}⟨100⟩ slip system. The boundaries of both types, consisting of pure edge dislocations with lines along [001], are symmetrical tilt boundaries with [001] rotation axes. The misorientations generated by the boundaries were estimated to range between 2–20 and 1–40′′, respectively. Low‐angle boundaries are thought to be formed by polygonization of dislocations, caused by thermoelastic stresses.