Premium
Texture of nanocrystalline solids: atomic scale characterization and applications
Author(s) -
E J. C.,
Cai Y.,
Zhong Z. Y.,
Tang M. X.,
Zhu X. R.,
Wang L.,
Luo S. N.
Publication year - 2018
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576717018040
Subject(s) - nanocrystalline material , texture (cosmology) , materials science , diffraction , orientation (vector space) , characterization (materials science) , grain size , crystallography , inverse , distribution function , optics , composite material , geometry , mathematics , physics , chemistry , thermodynamics , computer science , nanotechnology , artificial intelligence , image (mathematics)
A methodology is presented to characterize the crystallographic texture of atomic configurations on the basis of Euler angles. Texture information characterized by orientation map, orientation distribution function, texture index, pole figure and inverse pole figure is obtained. The paper reports the construction and characterization of the texture of nanocrystalline configurations with different grain numbers, grain sizes and percentages of preferred orientation. The minimum grain number for texture‐free configurations is ∼2500. The effect of texture on deducing grain size from simulated X‐ray diffraction curves is also explored as an application case of texture analysis. In addition, molecular dynamics simulations are performed on initially texture‐free nanocrystalline Ta under shock‐wave loading, which shows a ⟨001⟩ + ⟨111⟩ double fiber texture after shock‐wave compression.