Premium
Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended Q range
Author(s) -
Karge Lukas,
Gilles Ralph,
Busch Sebastian
Publication year - 2017
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576717011463
Subject(s) - calibration , pixel , anisotropy , isotropy , optics , sensitivity (control systems) , physics , detector , geometry , wavelength , position (finance) , range (aeronautics) , computational physics , materials science , mathematics , electronic engineering , composite material , engineering , finance , quantum mechanics , economics
An improved data‐reduction procedure is proposed and demonstrated for small‐angle neutron scattering (SANS) measurements. Its main feature is the correction of geometry‐ and wavelength‐dependent intensity variations on the detector in a separate step from the different pixel sensitivities: the geometric and wavelength effects can be corrected analytically, while pixel sensitivities have to be calibrated to a reference measurement. The geometric effects are treated for position‐sensitive 3 He proportional counter tubes, where they are anisotropic owing to the cylindrical geometry of the gas tubes. For the calibration of pixel sensitivities, a procedure is developed that is valid for isotropic and anisotropic signals. The proposed procedure can save a significant amount of beamtime which has hitherto been used for calibration measurements.