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A microcontroller for in situ single‐crystal diffraction measurements with a PILATUS‐2M detector under an alternating electric field
Author(s) -
Choe Hyeokmin,
Heidbrink Stefan,
Ziolkowski Michael,
Pietsch Ullrich,
Dyadkin Vadim,
Gorfman Semën,
Chernyshov Dmitry
Publication year - 2017
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576717006197
Subject(s) - reciprocal lattice , beamline , physics , optics , electric field , synchrotron , detector , synchrotron radiation , materials science , diffraction , optoelectronics , beam (structure) , quantum mechanics
A new data acquisition system for in situ time‐resolved three‐dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low‐voltage signal, a pixel area detector serving as a master clock and a high‐voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre‐programmed shape. The system has been tested at the Swiss–Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X‐ray scattering from a functional perovskite‐based ferroelectric single crystal.