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Interface‐sensitive imaging by an image reconstruction aided X‐ray reflectivity technique
Author(s) -
Jiang Jinxing,
Hirano Keiichi,
Sakurai Kenji
Publication year - 2017
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s160057671700509x
Subject(s) - optics , x ray reflectivity , reflectivity , sample (material) , materials science , interface (matter) , physics , thermodynamics , capillary number , capillary action , composite material
Recently, the authors have succeeded in realizing X‐ray reflectivity imaging of heterogeneous ultrathin films at specific wavevector transfers by applying a wide parallel beam and an area detector. By combining in‐plane angle and grazing‐incidence angle scans, it is possible to reconstruct a series of interface‐sensitive X‐ray reflectivity images at different grazing‐incidence angles (proportional to wavevector transfers). The physical meaning of a reconstructed X‐ray reflectivity image at a specific wavevector transfer is the two‐dimensional reflectivity distribution of the sample. In this manner, it is possible to retrieve the micro‐X‐ray reflectivity (where the pixel size is on the microscale) profiles at different local positions on the sample.