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NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small‐Angle X‐ray Scattering
Author(s) -
Allen Andrew J.,
Zhang Fan,
Kline R. Joseph,
Guthrie William F.,
Ilavsky Jan
Publication year - 2017
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576717001972
Subject(s) - small angle x ray scattering , nist , scattering , calibration , small angle scattering , small angle neutron scattering , intensity (physics) , calibration curve , optics , neutron scattering , materials science , range (aeronautics) , computational physics , physics , chemistry , computer science , chromatography , quantum mechanics , detection limit , natural language processing , composite material
The certification of a new standard reference material for small‐angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small‐Angle X‐ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra‐small‐angle X‐ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certified Q range, Q = 0.008–0.25 Å −1 , together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X‐ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small‐angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification.